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SRX

submicron X-ray fluorescence microprobe (XRF mapping, XANES, XRF-tomography, diffraction), 5-ID; modelled from public beamline config.

Property Value
Facility NSLS-II (EPICS / bluesky)
Sector Sector 5
Source insertion-device
Modelled reverse-engineered, full coverage

Generated from the descriptor

This page is generated from the descriptor at deployments/srx/beamline.yaml. Edit the descriptor, not this page.

The device handles are read from the facility's public controls configuration and verified against it; vendor parts, energies, and physical positions are not in it and are carried confirm until beamline staff verify them. Source: NSLS2/srx-profile-collection.

Enclosures

Enclosure Role Facility Permit signal
5-ID-A optics-hutch nsls2 confirm: PSS search-and-secure permit leaf not in source; shutters are XF:05ID-PPS{Sh:WB}, 05IDA-PPS:1{PSh:2}, 05IDB-PPS:1{PSh:4} (PSS-1)
5-ID-D experiment-hutch nsls2 confirm: PSS permit leaf unknown; the micro (05IDB) vs nano (05IDD) endstation hutch boundary to confirm (ENC-1)

The beamline

The first beamline running several techniques on one instrument: scanning XRF, XANES, XRF-tomography, diffraction, and imaging across a micro and a KB-focused nano endstation.

  • Source: the beam, produced and conditioned before the sample.
  • Sample: the sample environment and its positioning.
  • Detector: what records the beam after the sample.
  • Controls: the control plane CORA's edge conducts over.

Not yet documented

This beamline has no Operations runbook and no live Experiment view, because CORA does not drive it yet. Both pages describe what an operator does with a running system, so writing them for a beamline CORA only models would be invention rather than documentation. The pilot at 2-BM carries both, and shows the shape they take once a deployment goes live.

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