Sample¶
Diffraction dichroism¶
The i06-1 endstation: resonant soft X-ray diffraction and dichroism, with a sample-orientation diffractometer, an absorption sample stage, and sample temperature control.
Enclosure: i06-1.
Note
The diffraction-dichroism sample circles bind the catalog Goniometer (the sample-orientation role), with a reciprocal-space PseudoAxis over them (the 4-ID / 8-ID / CSX diffractometer pattern; the Assembly is named, not built, DIFF-1). The absorption stage binds LinearStage as a design-phase placeholder (STAGE-1). The scattering detector and the incident-flux / drain-current monitors are not dodal devices and are carried as DET-1, not invented.
| Name | Family | PV | Key specs | Replaceable | Status |
|---|---|---|---|---|---|
Diffractometer |
Goniometer |
BL06J-EA-DDIFF-01: |
diffraction-dichroism sample circles (sample x/y/z, theta incidence, chi / phi orientation) plus the DET:2THETA / DET:Y detector arm; the circle roles and the Assembly(Diffractometer) binding are DIFF-1 | new confirm |
|
ReciprocalSpace |
PseudoAxis |
confirm: reciprocal-space virtual axis over the diffraction-dichroism circles; the inverse-kinematics partition rule is deferred as on 4-ID / 8-ID / CSX (DIFF-2) |
reciprocal-space pseudo-axis over the diffractometer (the Diffractometer reciprocal_space pattern); DIFF-2 | new confirm |
|
AbsorptionStage |
LinearStage |
BL06J-EA-XABS-01: |
the XAS / absorption sample stage (x / y / theta); design-phase placeholder, whether theta warrants Goniometer is STAGE-1 | new confirm |
|
CoolingController |
TemperatureController |
BL06J-EA-TCTRL-02: |
Lakeshore 336 sample cooling controller; reuses the graduated Family (presents Regulator); range is TEMP-1 | new confirm |
|
HeatingController |
TemperatureController |
BL06J-EA-TCTRL-03: |
Lakeshore 336 sample heating controller; reuses the graduated Family (presents Regulator); cooling-vs-heating is a per-Asset setting (TEMP-1) | new confirm |
Peem¶
The PEEM (photoemission electron microscopy) endstation: a UHV sample manipulator under the electron-optical imaging column.
Enclosure: i06-2.
Note
The PEEM UHV sample manipulators bind the graduated Manipulator Family (the SIX / ESM serial multi-axis sample-manipulator precedent); the energy-slit translation and axis count are per-Asset settings. The PEEM electron-optical column and its magnified electron-image detector are NOT dodal devices (only the manipulators are), so the PEEM imaging detector is carried as PEEM-1, the ElectronMicroscope anatomy, NOT coined here: it is electron-imaging, distinct from the photon Camera and from the energy-analyzing ElectronAnalyzer.
| Name | Family | PV | Key specs | Replaceable | Status |
|---|---|---|---|---|---|
PeemManipulator |
Manipulator |
BL06K-MO-PEEM-01: |
the i06-2 PEEM UHV sample manipulator (x / y / phi plus the es energy-slit translation); reuses the graduated Family; axis set is MANIP-1 | new confirm |
|
PeemSampleStage |
Manipulator |
BL06I-MO-PEEM-01: |
the i06-branch PEEM sample stage (x / y / phi); reuses the graduated Family (MANIP-1) | new confirm |