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P08

high-resolution diffraction (surface / interface, reflectivity, powder / single-crystal) on a six-circle Kohzu diffractometer with a rich detector set (Eiger / Pilatus / Mythen / PerkinElmer / Vortex); coins no new Family, reusing the pending diffraction Method.

Property Value
Facility PETRA III (Tango / Sardana)
Sector P08
Source insertion-device
Modelled reverse-engineered, full coverage

Generated from the descriptor

This page is generated from the descriptor at deployments/p08/beamline.yaml. Edit the descriptor, not this page.

The device handles are read from the facility's public controls configuration and verified against it; vendor parts, energies, and physical positions are not in it and are carried confirm until beamline staff verify them. Source: python-nxstools-extras-p08.

Enclosures

Enclosure Role Facility Permit signal
p08-oh optics-hutch petra-iii confirm: DESY PSS permit signal for the P08 optics hutch; not in the OnlineXML (PSS-1)
p08-eh experiment-hutch petra-iii confirm: DESY PSS permit signal for the P08 experiment endstation; not in the OnlineXML (PSS-1)

The beamline

High-resolution diffraction and reflectivity: a precise multi-circle diffractometer for surfaces, interfaces, and thin films.

  • Source: the beam, produced and conditioned before the sample.
  • Sample: the sample environment and its positioning.
  • Detector: what records the beam after the sample.
  • Controls: the control plane CORA's edge conducts over.

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