Detector¶
The SPECS hemispherical analyzer, the fluorescence detectors, and the electron-yield chain. First cut; PVs read from the profile collection, carried confirm.
IOS detection is photon-in / electron-out and photon-in / photon-out at once: the SPECS hemispherical analyzer records the photoelectron spectrum for ambient-pressure photoemission, while the Vortex and Xspress3 silicon-drift detectors and the scaler-read electron-yield channels record the soft NEXAFS / XAS signal. They are modelled in the detection stage of the descriptor.
The analyzer binds the catalog ElectronAnalyzer Family (the third sighting after ESM and SST, and the first non-Scienta and first ambient-pressure one); the silicon-drift detectors bind EnergyDispersiveSpectrometer; the scaler and the Au-mesh I0 reference bind FluxMonitor; the exit-slit diagnostic camera binds Camera. No new family is introduced (see Model).
Detection chain¶
| Device | Family | Design spec / note |
|---|---|---|
ElectronAnalyzer |
ElectronAnalyzer |
SPECS hemispherical analyzer, the AP-PES detector; pass energy / lens mode / kinetic energy / acquisition mode are settings (DET-1) |
FluorescenceDetector |
EnergyDispersiveSpectrometer |
Vortex silicon-drift detector + MCA, partial-fluorescence-yield XAS (DET-2) |
FluorescenceArray |
EnergyDispersiveSpectrometer |
Xspress3 four-channel silicon-drift detector (DET-2) |
Scaler |
FluxMonitor |
electron-yield (TEY / PEY) counting electronics behind the CurrAmp:1/2/3 current amplifiers (DET-3) |
IncidentFluxMonitor |
FluxMonitor |
gold-mesh I0 reference for incident-flux normalization (DET-3) |
DiagnosticCamera |
Camera |
exit-slit YAG centroid diagnostic camera |
The analyzer and the yield chain¶
The SPECS analyzer (XF:23ID2-ES{SPECS}) disperses photoelectrons by kinetic energy over a window set by the pass energy and lens mode, acquiring either a full spectrum or a single counting channel. It measures electrons out, not photons, so no photon-detector Family fits; it binds ElectronAnalyzer, the same Family the ESM ARPES and SST HAXPES Scienta analyzers bind. IOS is the third sighting and the first non-Scienta and first ambient-pressure one; the analyzer make, the lens-mode set, and the pass-energy range are a per-Asset settings or bound-Model difference, not a Family split (DET-1).
The soft NEXAFS / XAS signal is read three ways, all as settings on the same chain rather than as separate devices: TEY (total electron yield, the sample drain current through the scaler and the CurrAmp amplifiers), PEY (partial electron yield, kinetic-energy-selected electrons through the analyzer), and PFY (partial fluorescence yield, a region-of-interest on the Vortex or Xspress3 silicon-drift detector). The Au mesh (XF:23ID2-BI{AuMesh:1) is the I0 reference for normalization. The scaler and the Au mesh both bind FluxMonitor; the silicon-drift detectors bind EnergyDispersiveSpectrometer (DET-2, DET-3).
Why no new detector family¶
IOS detection is reinforcement: the analyzer reuses ElectronAnalyzer (third sighting), the silicon-drift detectors reuse EnergyDispersiveSpectrometer, the counters reuse FluxMonitor, and the diagnostic camera reuses Camera. The TEY / PEY / PFY detection modes are carried as per-Asset settings, not new Families; the detector models and channel maps are DET-1, DET-2, and DET-3. See Inventory for the Asset tree.